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System-on-Chip Test Scheduling with Defect-Probability and Temperature Considerations

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Linköping Studies in Science and Technology Thesis No. 1313

System-on-Chip Test Scheduling with

Defect-Probability and Temperature Considerations

by

Zhiyuan He

Submitted to Linköping Institute of Technology at Linköping University in partial fulfilment of the requirements for the degree of Licentiate of Engineering

Department of Computer and Information Science Linköpings universitet

SE-581 83 Linköping, Sweden

References

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