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Abstract
In this Masters thesis project a dual energy post-reconstruction Computed Tomography technique, Basis Material Decomposition, has been implemented using a commercial scanner from General Electric, focusing on materials analysis. The aim of the project is to analyze the Versimax® composite in its three main constituents (diamond, silicon carbide and graphite) and obtain the volume fraction of each for every pixel of the extracted slices. Electron microscopy and X-Ray diffraction techniques have been used for verification of the results. During implementation it managed to identify all the defects infused in a number of an unknown samples, apart from one whose flaw composites were not included in the basis materials. This method is useful in industrial scale because the sample is not destroyed during the analysis, requires no sample preparation and gives the operator the
opportunity to obtain quantitative information for all the defects in a sample with only two scans. To facilitate industrial use the application was converted into a single self-instructing, executable file.
