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Electronic structure of buried Si layers in
GaAs(001) as studied by soft-x-ray emission
P. O. Nilsson, J. Kanski, J. V. Thordson, T. G. Andersson, J. Nordgren, J. Guo and Martin Magnuson
N.B.: When citing this work, cite the original article.
Original Publication:
P. O. Nilsson, J. Kanski, J. V. Thordson, T. G. Andersson, J. Nordgren, J. Guo and Martin Magnuson, Electronic structure of buried Si layers in GaAs(001) as studied by soft-x-ray emission, 1995, Physical Review B. Condensed Matter and Materials Physics, (52), R8643-R8645.
http://dx.doi.org/10.1103/PhysRevB.52.R8643
Copyright: American Physical Society
http://www.aps.org/
Postprint available at: Linköping University Electronic Press
http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-17476