RECENT PROGRESS AND APPLICATIONS IN PARTIAL ELEMENT EQUIVALENT CIRCUIT
MODELING
Jonas Ekman
Email: Jonas.Ekman@csee.ltu.se Lule˚ a University of Technology
SE-971 87 Lule˚ a Sweden
This paper presents a number of recent developments and applications within electromagnetic modeling using the PEEC method. The recent extensions of the classical PEEC formulation to handle nonorthogonal geometrical ob- jects and frequency dependent dielectric losses are discussed together with numerical examples. Further, the time complexity for current PEEC based EM solvers, both quasi-static, full-wave, time- and frequency- domain, are detailed. We show that the bottleneck for future PEEC based EM solvers are the partial element calculation procedure. Last, applications of the PEEC method to new areas including modeling of embedded passives and antenna analysis is discussed.
1 Introduction
The partial element equivalent circuit (PEEC) [1]-[3] method was developed at IBM by A. E. Ruehli to facilitate VLSI inductance calculations [1] in the early 1970s and is nu- merically equivalent to a full-wave method of moments solution with Galerkin matching.
In the method, the electromagnetic problem is transformed into the circuit domain and solved using circuit analysis techniques. This enables a combined solution of electronic functionality and electromagnetic effects. The method is often used for electrical inter- connect and package analysis but has evolved over the years with new application areas continuously reported.
2 Nonorthogonal PEEC Formulation
This section gives an outline of the geometrical nonorthogonal extension to the PEEC method. The objects can be quadrilateral and/or hexahedral conductors or dielectrics which can be both orthogonal and/or nonorthogonal.
The starting point for the derivation is the total electric field at the material which is E ~
i( ~ r
g, t) = J( ~ ~ r
g, t)
σ + ∂ ~ A( ~ r
g, t)
∂t + ∇φ( ~ r
g, t) (1)
where ~ E
iis the incident electric field, ~ J is the current density in a conductor and ~ A and φ
are vector and scalar potentials, respectively. As indicated above, the dielectric areas are
taken into account as an excess current rather than a capacitance with the scalar potential using the volume equivalence theorem. This is accomplished by adding and subtracting
²
0∂ ~∂tEin the Maxwell equation for ~ H, or
∇ × ~ H( ~ r
g, t) = ~ J( ~ r
g, t) + ²
0(²
r− 1) ∂ ~ E( ~ r
g, t)
∂t + ²
0∂ ~ E( ~ r
g, t)
∂t . (2)
In (2), the current is written as a total current
J( ~ ~ r
g, t) = ~ J
C( ~ r
g, t) + ²
0(²
r− 1) ∂ ~ E( ~ r
g, t)
∂t (3)
where ~ J
Cis the conductor current and the remainder of the equations is the equivalent polarization current due to the dielectric.
By using the vector potential ~ A and the scalar potential φ using the free space retardation time we can formulate an integral equation for the electric field at a point ~ r
gwhich is to be located either inside a conductor or inside a dielectric region. Starting from (1) with the externally applied electric field set to zero, and substituting for ~ A and φ. The final integral equation to be solved is
~ˆn × ~ E
i( ~ r
g, t) = ~ˆ n ×
J( ~ ~ r
g, t) σ
+ ~ˆ n ×
µ
Z
v0
G( ~ r
g, ~ r
g0) ∂ ~ J( ~ r
g0, t
d)
∂t dv0
+ ~ˆ n ×
²
0(²
r− 1)µ
Z
v0
G( ~ r
g, ~ r
g0) ∂
2E( ~ ~ r
g0, t
d)
∂t
2
(4)
+ ~ˆ n ×
·
∇
²
0Z
v0
G( ~ r
g, ~ r
g0)q( ~ r
g0, t
d)dv0
¸
where ~ˆ n is the surface normal to the body surfaces.
2.1 Interpretation as circuit equivalent
To represent the current flow in orthogonal cells, we use the convenient weighting function J = I/(W T ) where I, J are the current and current density and W, T are the cell width and thickness, respectively. The generalization of the current distribution for nonorthog- onal hexahedral cell shapes is given by
J
a= h
a¯
¯
¯
∂ ~rg
∂a
· (
∂ ~∂brg×
∂ ~∂crg)
¯¯¯I
a(5)
where J
band J
ccan easily be found by permuting the indices. We call the quotient in (5)
the weight w
awhich simplifies (5) to J
a= w
aI
a. We should note that all the above
quantities are a function of the local position coordinates a, b, c. Next, we use an integral
or inner product operator V
a=
RaRbRcw
a~ˆa · ~ E
¯¯¯∂ ~∂arg· (
∂ ~∂brg×
∂ ~∂crg)
¯¯¯da db dc to integrate the
terms of (4) where ~ E(a, b, c) is the ~ E field term to be integrated. We need to apply the
inner product to each term in (4) to transform each term to a voltage drop across a circuit
element in the KVL equation. Next, we integrate the right hand terms of the integral
equation (4). After applying the inner product, the first element on the right hand side leads to the series resistance term in the form
R
a= 1 σ
Z
a
Z
b
Z
c
h
a 2¯
¯
¯
∂ ~rg
∂a
· (
∂ ~∂brg×
∂ ~∂crg)
¯¯¯da db dc (6) The second right hand side term of (4) gives a generalization of the partial inductance concept for nonorthogonal problems, or
Lp
aa0= µ
Z
a
Z
b
Z
c
Z
a0
Z
b0
Z
c0
(~ˆ a · ~ ˆ a
0) h
a0G[ ~ r
g(a, b, c); ~ r
g(a
0, b
0, c
0)] da
0db
0dc
0h
ada db dc (7) From the third right hand side term of (4), the nonorthogonal PEEC excess capacitance expression is extracted, see further [4]. Finally, the fourth right hand side term of (4) we get for the normalized coefficients of potential
P n
aa0= 1
²
Z
a
Z
b
Z
a0
Z
b0
G[ ~ r
g(a, b, c); ~ r
g0(a
0, b
0, c
0)] da0 db0 da db (8) Here a, b, a
0, b
0are interpreted in a general sense for the appropriate cell orientations.
Pii
1 IPi Pjj
1 IPj
Lpmm Rmm
ICi ICj
a I b
VmmL
Figure 1: Basic PEEC cell.
In the PEEC circuit solution, terminal or nodal variables are associated with each of the re- sultant circuit elements and are collected in an overall circuit solver vector of unknowns.
The solution vector variables are quantities like the potentials ~ Φ, and other conventional circuit variables like i, v, q where~i is the currents, ~v the ~ voltage, and ~q some charges etc. If no other cir- cuit elements are included, the solution vector used is (~ Φ,~i)
Tas the only unknowns since this
vector directly yields the most useful EM circuit output variables. Here we point out that in part, the inclusion of both ~ Φ and ~i is, responsible for the full spectrum property of the solution methodology such that the correct dc solution is obtained.
2.2 Example
To demonstrate the nonorthogonal PEEC formulation we consider the non-uniform trans-
mission line (TL) depicted in Fig. 2 (a). The TL is 100 mm. long (L), the width (W)
varies from 5 to 9 mm., the thickness (T) of the conductors are 0.1 mm., and the two
conductors are spaced 10 x T. The TL is differentially excited, at the near-end, using a 1
ns., 1 mA current pulse and terminated, at the far-end, in a 50 Ω resistor. The structure
is studied using three different PEEC models. First, the structure is modelled using the
original PEEC formulation with orthogonal surface and volume cells (giving a stair-case
approximation of the geometry) entitled Orthogonal, coarse mesh in Fig. 2 (b). Second,
the first model was refined using a much larger number of surface and volume cells (to
make a better representation of the geometry), this test is entitled Orthogonal, fine mesh
in Fig. 2 (b). Finally, the TL is modelled using the nonorthogonal formulation using
the same number of cells as for the first test, see Table 1 for details on cell count. The
nonorthogonal test is entitled Nonorthogonal, coarse mesh in Fig. 2 (b). The results in
Table 1: Detail for non-uniform TL test.
PEEC model PEEC model
Coarse mesh Staircase approximation Ind. cells
self 10 mutual 45
Ind. cells
self 490
mutual 119 805 Cap. cells
self 20
mutual 190
Cap. cells
self 300
mutual 44 850
Fig. 2 (b) shows clearly that the response from the nonorthogonal PEEC formulation is more similar to the orthogonal formulation using a large number of cells compared to the first test using a coarse discretization.
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 5.5
0 0.01 0.02 0.03 0.04 0.05 0.06
Time [/ns]
[/V]
Near−end voltage
Orthogonal, coarse mesh Orthogonal, fine mesh Nonorthogonal, coarse mesh
(a) (b)
Figure 2: Nonorthogonal TL geometry (a) and comparison for near-end voltages using orthogonal (staircase approximation) and nonorthogonal PEEC formulation (b).
3 Frequency dependent lossy dielectric formulation
The inclusion of finite, lossy dielectrics in the PEEC method is detailed in [5] by the use of excess capacitance of a dielectric cell. Since the frequency dependent dielectric losses are becoming more important, the PEEC method was recently extended [6] to deal with dielectrics described in terms of a frequency dependent permittivity, ε(s), which can be approximated by a sum of Lorentz and Debye terms. Assuming N
Dto be the number of Debye terms and N
Lto be the number of Lorentz terms, the frequency dependent permittivity get the following representation in the Laplace domain
ε(s) = ε
ε
∞+
ND
X
m=1
(ε
DS(m) − ε
D∞(m)) 1 + sτ (m) +
NL
X
m=1
(ε
LS(m) − ε
L∞(m))ω(m)
21 + sδ(m) + ω
0(m)
2
(9)
where ε
∞=
PNm=1Dε
D∞(m) +
PNm=1Lε
L∞(m), ε
DS(m), and ε
LS(m) are the static dielectric
constants for the m-th Debye and Lorentz medium, ω
0(m) is the resonance frequency of
R
DC
DC
D 8b a
R
LC
L
C
L 8L
La b
(a) (b)
Figure 3: Debye (a) and Lorentz (b) media equivalent circuits.
the m-th Lorentz medium.The loss constant of the m-th Debye term is τ (m). The static permittivity of such a medium can be defined as ε
S=
PNm=1Dε
DS(m) +
PNm=1Lε
LS(m). The admittance corresponding to the PEEC excess capacitance can be represented as
sC
e(s) = sC
∞(s) +
ND
X
m=1
Y
D(s) +
NL
X
m=1
Y
L(s) (10)
which can be synthesized to an equivalent circuit and easily included in the PEEC solver.
By using equivalent circuits for the Debye and Lorentz media, as detailed in Fig. 3, the MNA stamp is easily realized by the use of an equivalent admittance, G
eq, and a current source, i
Seq. This gives the following MNA stamp for a dielectric cell connected between node α and β
α . β . .
α . β .
G
eq−G
eq−G
eqG
eq
φ
1φ
α. φ
β~i
1.
~i
nv
=
. i
Seq.
−i
Seqv
S1. v
Sn
(11)
where φ
nis the solution of node potentials, ~i
nis the solution of volume cell currents, and v
Snare external voltage sources (excitation).
4 Time Complexity for PEEC Solvers
It is relevant to estimate the order of complexity for each part in a PEEC, full-wave solver.
For this purpose, Table 2 details the serial time complexity for the serial, full-wave, time- and frequency- domain, MNA based PEEC formulation outlined in [7]. In the table, the variable n = (n
C+ n
L) is the number of unknowns (node voltages and volume cell currents) hence the number of columns and rows of the MNA system matrix. However, for a general PEEC model, n
2is not the maximum number of partial elements, since the specific problem at hand affects the sparsity of the partial inductance matrix. For example, the number of partial elements for a 2D (L
p, R, P )PEEC model of a plate with same number of partition in the x- and y- directions would be
(n
L− 1)
2+ 8n
L4 + (n
C− 1)
2+ 2n
C2 , (12)
equal to O(m)
2complexity (m = max(n
L, n
C)). From (12) it is evident that the number of nodes (coefficients of potential) contributes substantially to the total number of partial elements for a PEEC model.
Table 2: Serial time complexity for full-wave PEEC solvers.
Moment FD PEEC TD PEEC
Time complexity Time complexity Meshing
↓
Element calculation
↓
System build-up†
↓
System solution
O (n) O (n
2)
?O (n
2)
¦O (n
itern
2)
O (n) O (n
2) O (n
1.5) O (n
itern
1.5)
?
Complex elements in the FD updated at each frequency of interest.
¦
System updated at each frequency of interest.
†